3D Surface Topography and Measuring Software Kit for Brightfield Microscopy is a powerful new visualization tool that enables you to present your bright field microscopic or stereomicroscopic images as completely in focus 3-dimensional images. Internal structure depth is not only clearly visible, but measurable! The visual effect of a 3D sample is represented in your display monitor's 2D space.

This unique new imaging kit combines the simplicity of In-Focus Automation image capture with the awe of a revolutionary new extended depth of field algorithm (EDF). The result is a view into the 3-dimensional information buried in all microscopic samples. Inspect and display sample surfaces, measure and record results. Unlike other topographic software packages that require fluorescence confocal or SEM image stacks our 3D Surface Topography and Measuring Software Kit will work with brightfield transmitted or reflected light image stacks! And unlike other EDF software packages there are virtually no image artifacts!

3D Surface Topography and Measuring Software Kit for Brightfield Light Microscopy allows optical microscopy and stereomicroscopy to achieve its fullest potential by enabling measurements, viewing, recording and display of 3D data in a 2D space. Displayable 'live motion' images can be saved as AVI files for Windows PowerPoint^© presentations.

This software kit works with microscope, stereomicroscope and macro image Z sequences using any illumination technique!

Software requires IPP Win 6.0, In-Focus Automation or Scope-Pro 5.1 and a motorized Z controlled microscope to achieve best results.

Includes on-site instruction in use.